Novel in –Situ heating transmission electron microscope holder for atomic resolution
Keywords:In- situ TEM instrumentation, Heating holder, finite element analysis, atomic resolution.
This study presents novel design of “in-situ” TEM heating holder. In-situ experimentations are important because hot deformation, dynamic recovery and dynamic recrystallization are important processes which are not well understood because it is very difficult to assess the nature microstructural processes solely from the traditional post mortem study of samples. We have designed an optimum heating holder that is dynamically stable for accuracy and image processes, capable of elevating the sample temperature up to 2000 K, with minimum controllable drift of the sample position. Sample drift is calculated. Thermal stressed induces in the sample are calculated. The in-depth finite element simulations provide detailed information about thermal and dynamic behavior of the heating holder. Finite element results show that the proposed design outperform the current heating technology. Based on the finite element results, a revised design is proposed that has lower temperature gradient among the sample, lower temperature difference between the sample and the TEM grids, lower thermal stresses in the sample, lower heat losses to the microscope parts. Furthermore, the present analysis provides the basis for the design of optimal heating holder for accurate measurements.